Reliant EMC

GTEM ITALIA TEM-Cells

Reliant EMC is proud to offer the following TEM Cells from GTEM Italia.
 
Technical Specifications
TEM 200
TEM 500
TEM 1000
TEM 3000
Frequency range
DC-200 MHz
DC-500 MHz
DC-1GHz
DC-3GHz
Height under the plate
30 cm
10cm
7,3cm
2,35cm
Dimensions (LxWxH)
130x70x62cm
60x30x22cm
54x45x18cm
15x8x6cm
Max. Input power
1,6KW long term
1KW long term
750W long term
400W long term
Field for a 25W amplifier
118V/m
350V/m
475V/m
1,4KV/m
Impedance
50 ohm
50 ohm
50 ohm
50 ohm
VSWR
<1.1
<1.1
<1.2
<1.2
Return Loss
>25dB
>25dB
>20dB
>20dB
Connector type
N
N
N
N or TNC, SMA
Weight
Approx. 40Kg
Approx. 20Kg.
Approx. 4,8Kg.
Approx. 1,6Kg.
Options
Signal and power supply filter
* Can be equipped with a test setup for IC or PCB acc. to SAE J1752-3

GTEM ITALIA TEM Cell Matrix

Transverse Electro Magnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz.
 
EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave.
 
TEM Cells can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.
 
TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc.
 
An external test signal applied through the input port of the TEM cell generates a consistent and predictable (plane wave) test field inside the TEM cell.
 
The radiation field emanating from a device (under test) located in the cell can also be detected through the signal generator port connected to an EMI receiver or a spectrum analyzer.
The Equipment Under Test (EUT) is placed on the bottom ground plane as in Open Area Test Site (OATS) and in accordance with the shielded enclosure conditions.
 
TEM cells are used in final compliance certification tests.
The IEC 61000-4-3 EMC standard requires a TEM cell for radiated susceptibility and radiated emission tests.
Integrated Circuits (IC), Micro Electro-Mechanical Systems (MEMS) devices and PCBs can also be tested according to the standard SAE J1752-3 .
 
TEM cells can deliver an equivalent OATS performance inside the comforts of a lab with minimum OATS errors.
 
The main advantage of a TEM cell over a strip-line is that the EUT is completely shielded (except a window to insert/monitor the EUT) from the external environment, thus producing results with negligible errors. This is one of the reasons why a TEM cell is qualified to perform final compliance tests.

 

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